JPH0518844Y2 - - Google Patents
Info
- Publication number
- JPH0518844Y2 JPH0518844Y2 JP11797687U JP11797687U JPH0518844Y2 JP H0518844 Y2 JPH0518844 Y2 JP H0518844Y2 JP 11797687 U JP11797687 U JP 11797687U JP 11797687 U JP11797687 U JP 11797687U JP H0518844 Y2 JPH0518844 Y2 JP H0518844Y2
- Authority
- JP
- Japan
- Prior art keywords
- inductively coupled
- coupled plasma
- frequency inductively
- mass spectrometer
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 50
- 150000002500 ions Chemical class 0.000 claims description 29
- 229910052786 argon Inorganic materials 0.000 claims description 25
- 239000007789 gas Substances 0.000 claims description 20
- 238000009616 inductively coupled plasma Methods 0.000 claims description 16
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 14
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 14
- 239000012530 fluid Substances 0.000 claims description 9
- 230000001105 regulatory effect Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 230000006698 induction Effects 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 150000001793 charged compounds Chemical class 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000006199 nebulizer Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11797687U JPH0518844Y2 (en]) | 1987-07-31 | 1987-07-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11797687U JPH0518844Y2 (en]) | 1987-07-31 | 1987-07-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6423866U JPS6423866U (en]) | 1989-02-08 |
| JPH0518844Y2 true JPH0518844Y2 (en]) | 1993-05-19 |
Family
ID=31361920
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11797687U Expired - Lifetime JPH0518844Y2 (en]) | 1987-07-31 | 1987-07-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0518844Y2 (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11183379B2 (en) * | 2019-04-01 | 2021-11-23 | Perkinelmer Health Sciences Canada, Inc. | Devices and Methods to improve background equivalent concentrations of elemental species |
-
1987
- 1987-07-31 JP JP11797687U patent/JPH0518844Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6423866U (en]) | 1989-02-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Jin et al. | A microwave plasma torch assembly for atomic emission spectrometry | |
| CA2796819C (en) | Oxidation resistant induction devices | |
| JPH0518844Y2 (en]) | ||
| JPH0518845Y2 (en]) | ||
| JPH0615392Y2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| CN114778507A (zh) | 基于一体化全角度激发源的原子荧光光谱仪及测量方法 | |
| JPH07123035B2 (ja) | 高周波誘導結合プラズマ・質量分析装置 | |
| JPH0736324B2 (ja) | 高周波誘導結合プラズマ・質量分析計 | |
| JPH0518842Y2 (en]) | ||
| JP2836190B2 (ja) | 高周波誘導結合プラズマ分析装置 | |
| JPH0541496Y2 (en]) | ||
| JP3118004B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH01117262A (ja) | 高周波誘導結合プラズマ分析計 | |
| JP3038839B2 (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH0638372Y2 (ja) | 高周波誘導結合プラズマ質量分析装置 | |
| JPS63308857A (ja) | 誘導結合プラズマ・質量分析計 | |
| JPH02227653A (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH04104449A (ja) | 高周波誘導プラズマ質量分析計 | |
| JPS62184755A (ja) | 高周波誘導結合プラズマ質量分析装置 | |
| JPS62208535A (ja) | 高周波誘導結合プラズマ・質量分析装置 | |
| JPS6398948A (ja) | 高周波誘導結合プラズマ・質量分析計 | |
| JPH06342697A (ja) | Ｉｃｐトーチ | |
| JPH03145051A (ja) | 高周波誘導結合プラズマ質量分析計 | |
| JPH06102249A (ja) | 高周波誘導結合プラズマ質量分析装置 | |
| JPH0412448A (ja) | 高周波誘導結合プラズマ質量分析計 |